Fayed, Marwan; Krapivsky, Paul; Byers, John; Crovella, Mark; Finkel, David; Redner, Sid
(Boston University Computer Science Department, 2003-01-17)
This paper explores reasons for the high degree of variability in the sizes of ASes that have recently been observed, and the processes by which this variable distribution develops. AS size distribution is important for a ...