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dc.contributor.authorLi, Jingen_US
dc.date.accessioned2015-04-27T16:48:35Z
dc.date.available2015-04-27T16:48:35Z
dc.date.issued2013en_US
dc.date.submitted2013en_US
dc.identifier.otheren_US
dc.identifier.urihttps://hdl.handle.net/2144/11118
dc.descriptionThesis (Ph.D.)--Boston Universityen_US
dc.description.abstractAs electronic and photonic devices shrink to the nanoscale, heat dissipation becomes the bottleneck for performance. As a result, understanding and controlling nanoscale thermal transport in thin films and across interfaces is a critical issue requiring new experimental tools. In this thesis, the development of an ultrafast thermoreflectance microscope for high resolution thermal property imaging is described. It can function as a time domain thermoreflectance (TDTR) or frequency domain thermoreflectance (FDTR) system. Design and implementation of the optical system will be introduced in detail. A thermal model derived from heat transfer theory is used to analyze the experimental data and obtain quantitative property maps for bulk and thin-film samples. The system is used to obtain temperature dependent thermal properties of single crystal diamond and thin film VO2, as well as thermal property maps of several thin film samples.en_US
dc.language.isoen_USen_US
dc.publisherBoston Universityen_US
dc.titleUltrafast thermoreflectance microscopyen_US
dc.typeThesis/Dissertationen_US
etd.degree.nameDoctor of Philosophyen_US
etd.degree.leveldoctoralen_US
etd.degree.disciplineElectrical Engineeringen_US
etd.degree.grantorBoston Universityen_US


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