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dc.contributor.authorLiu, Minen_US
dc.contributor.authorHarbaugh, A. G.en_US
dc.coverage.spatialSan Antonio, TXen_US
dc.date.accessioned2018-05-31T18:01:55Z
dc.date.available2018-05-31T18:01:55Z
dc.identifier.citationAG Harbaugh, Min Liu. "Random Contamination and Select Response Styles Affecting Measures of Fit and Reliability in Factor Analysis." American Educational Research Association Annual Conference 2018. San Antonio, TX, 2017-04-27 - 2017-05-01
dc.identifier.urihttps://hdl.handle.net/2144/29238
dc.description.abstractThis research examines the effects of nonattending response pattern contamination and select response style patterns on measures of model fit (CFI) and internal reliability (Cronbach's α). A simulation study examines the effects resulting from percentage of contamination, number of manifest items measured and sample size. Initial results indicate that sample size very mildly affects CFI but does not influence α. Percent contamination decreases both CFI and α in a nearly linear fashion over a limited range of contamination. Finally, whereas an increase in the number of manifest items increases resilience to random contamination for α, the opposite was observed for CFI. An increase in the number of manifest items resulted in larger decreases in CFI. Implications are briefly discussed.en_US
dc.subjectLikert-type dataen_US
dc.subjectReliabilityen_US
dc.subjectModel fiten_US
dc.subjectNonattending response patternsen_US
dc.subjectResponse stylesen_US
dc.titleRandom contamination and select response styles affecting measures of fit and reliability in factor analysisen_US
dc.typeConference materialsen_US
pubs.elements-sourcemanual-entryen_US
pubs.notesEmbargo: Not knownen_US
pubs.organisational-groupBoston Universityen_US
pubs.organisational-groupBoston University, School of Educationen_US
pubs.publication-statusPublished onlineen_US
dc.date.online2017-05-02
dc.date.online2017-05-02


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