High-resolution Imaging of nanoparticles in wide-field interferometric scattering microscopy

Thumbnail
Date Issued
2019
Publisher Version
https://doi.org/10.1364/COSI.2019.CW4A.4
Author(s)
Yurdakul, Celalettin
Avci, Oguzhan
Matlock, Alex
Tian, Lei
Ozbay, Ekmel
Ünlü, M. Selim
Share to FacebookShare to TwitterShare by Email
Export Citation
Metadata
Show full item record
Permanent Link
https://hdl.handle.net/2144/40199
Version
Published version
Citation (published version)
Celalettin Yurdakul, Oguzhan Avci, Alex Matlock, Lei Tian, Ekmel Ozbay, M Selim Ünlü. 2019. "High-resolution Imaging of Nanoparticles in Wide-field Interferometric Scattering Microscopy." Computational Optical Sensing and Imaging. Imaging and Applied Optics 2019. https://doi.org/10.1364/cosi.2019.cw4a.4
Abstract
Single particle interferometric scattering microscopy has demonstrated great capability in label-free imaging of sub-wavelength dielectric nanoparticles (r<25 nm); however, it suffers from diffraction-limited resolution. Here, we demonstrate ~2-fold improvement in lateral resolution upon asymmetric illumination.
Rights
© 2019 The Author(s)
Collections