High-resolution Imaging of nanoparticles in wide-field interferometric scattering microscopy
Ünlü, M. Selim
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Citation (published version)Celalettin Yurdakul, Oguzhan Avci, Alex Matlock, Lei Tian, Ekmel Ozbay, M Selim Ünlü. 2019. "High-resolution Imaging of Nanoparticles in Wide-field Interferometric Scattering Microscopy." Computational Optical Sensing and Imaging. Imaging and Applied Optics 2019. https://doi.org/10.1364/cosi.2019.cw4a.4
Single particle interferometric scattering microscopy has demonstrated great capability in label-free imaging of sub-wavelength dielectric nanoparticles (r<25 nm); however, it suffers from diffraction-limited resolution. Here, we demonstrate ~2-fold improvement in lateral resolution upon asymmetric illumination.
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