First born model for reflection-mode Fourier ptychographic microscopy

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Date Issued
2018
Publisher Version
10.1364/math.2018.mm3d.2
Author(s)
Matlock, Alex
Sentenac, Anne
Yi, Ji
Tian, Lei
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Permanent Link
https://hdl.handle.net/2144/40210
Version
Published version
Citation (published version)
Alex Matlock, Anne Sentenac, Ji Yi, Lei Tian. 2018. "First Born model for reflection-mode Fourier ptychographic microscopy." Mathematics in Imaging. Mathematics in Imaging. https://doi.org/10.1364/math.2018.mm3d.2
Abstract
We validate a first Born approximation based model for Reflection-mode Fourier ptychography under the semi-infinite boundary condition. Our model enables optical thickness and absorption recovery with enhanced resolution from thin samples.
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© 2018 The Author(s)
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