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    Deep metric learning to rank

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    Date Issued
    2019-06
    Publisher Version
    10.1109/cvpr.2019.00196
    Author(s)
    Cakir, Fatih
    He, Kun
    Xia, Xide
    Kulis, Brian
    Sclaroff, Stan
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    Permanent Link
    https://hdl.handle.net/2144/40725
    Version
    Accepted manuscript
    Citation (published version)
    Fatih Cakir, Kun He, Xide Xia, Brian Kulis, Stan Sclaroff. 2019. "Deep Metric Learning to Rank." 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). 2019-06-15 - 2019-06-20. https://doi.org/10.1109/cvpr.2019.00196
    Abstract
    We propose a novel deep metric learning method by revisiting the learning to rank approach. Our method, named FastAP, optimizes the rank-based Average Precision measure, using an approximation derived from distance quantization. FastAP has a low complexity compared to existing methods, and is tailored for stochastic gradient descent. To fully exploit the benefits of the ranking formulation, we also propose a new minibatch sampling scheme, as well as a simple heuristic to enable large-batch training. On three few-shot image retrieval datasets, FastAP consistently outperforms competing methods, which often involve complex optimization heuristics or costly model ensembles.
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    • ENG: Electrical and Computer Engineering: Scholarly Papers [252]
    • BU Open Access Articles [3664]


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