Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy
MetadataShow full item record
Citation (published version)Jiaji Li, Alex Matlock, Yunzhe Li, Qian Chen, Lei Tian, Chao Zuo. 2020. "Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy." Photonics Research, Volume 8, pp. 1818 - 1826. https://doi.org/10.1364/PRJ.403873
We propose label-free and motion-free resolution-enhanced intensity diffraction tomography (reIDT) recovering the 3D complex refractive index distribution of an object. By combining an annular illumination strategy with a high numerical aperture (NA) condenser, we achieve near-diffraction-limited lateral resolution of 346 nm and axial resolution of 1.2 μm over 130 μm×130 μm×8 μm volume. Our annular pattern matches the system’s maximum NA to reduce the data requirement to 48 intensity frames. The reIDT system is directly built on a standard commercial microscope with a simple LED array source and condenser lens adds-on, and promises broad applications for natural biological imaging with minimal hardware modifications. To test the capabilities of our technique, we present the 3D complex refractive index reconstructions on an absorptive USAF resolution target and Henrietta Lacks (HeLa) and HT29 human cancer cells. Our work provides an important step in intensity-based diffraction tomography toward high-resolution imaging applications.
Rights© 2020 Chinese Laser Press.