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dc.contributor.authorYurdakul, Celalettinen_US
dc.contributor.authorÜnlü, M. Selimen_US
dc.coverage.spatialUnited Statesen_US
dc.date.accessioned2021-05-12T20:05:35Z
dc.date.issued2020-12-01
dc.identifierhttps://www.ncbi.nlm.nih.gov/pubmed/33258864
dc.identifier.citationCelalettin Yurdakul, M Selim Ünlü. 2020. "Computational nanosensing from defocus in single particle interferometric reflectance microscopy." Opt Lett, Volume 45, Issue 23, pp. 6546 - 6549. https://doi.org/10.1364/OL.409458
dc.identifier.issn1539-4794
dc.identifier.urihttps://hdl.handle.net/2144/42545
dc.description.abstractSingle particle interferometric reflectance (SPIR) microscopy has been studied as a powerful imaging platform for label-free and highly sensitive biological nanoparticle detection and characterization. SPIR's interferometric nature yields a unique 3D defocus intensity profile of the nanoparticles over a large field of view. Here, we utilize this defocus information to recover high signal-to-noise ratio nanoparticle images with a computationally and memory efficient reconstruction framework. Our direct inversion approach recovers this image from a 3D defocus intensity stack using the vectorial-optics-based forward model developed for sub-diffraction-limited dielectric nanoparticles captured on a layered substrate. We demonstrate proof-of-concept experiments on silica beads with a 50 nm nominal diameter.en_US
dc.format.extentp. 6546 - 6549en_US
dc.languageeng
dc.language.isoen_US
dc.relation.ispartofOpt Lett
dc.rights© 2020 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.en_US
dc.subjectOpticsen_US
dc.subjectOptical physicsen_US
dc.subjectQuantum physicsen_US
dc.subjectElectrical and electronic engineeringen_US
dc.titleComputational nanosensing from defocus in single particle interferometric reflectance microscopyen_US
dc.typeArticleen_US
dc.description.versionAccepted manuscripten_US
dc.identifier.doi10.1364/OL.409458
dc.description.embargo2021-12-01
pubs.elements-sourcepubmeden_US
pubs.notesEmbargo: 12 monthsen_US
pubs.organisational-groupBoston Universityen_US
pubs.organisational-groupBoston University, College of Engineeringen_US
pubs.organisational-groupBoston University, College of Engineering, Department of Electrical & Computer Engineeringen_US
pubs.publication-statusPublisheden_US
dc.identifier.mycv576056


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