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dc.contributor.authorVarshney, Lav R.en_US
dc.contributor.authorMitter, Sanjoy K.en_US
dc.contributor.authorGoyal, Vivek K.en_US
dc.date.accessioned2021-06-24T15:45:48Z
dc.date.available2021-06-24T15:45:48Z
dc.date.issued2012-09
dc.identifier.citationLav R Varshney, Sanjoy K Mitter, Vivek K Goyal. 2012. "An Information-Theoretic Characterization of Channels That Die." IEEE Transactions on Information Theory, Volume 58, Issue 9, pp. 5711 - 5724. https://doi.org/10.1109/tit.2012.2199078
dc.identifier.issn0018-9448
dc.identifier.issn1557-9654
dc.identifier.urihttps://hdl.handle.net/2144/42709
dc.description.abstractGiven the possibility of communication systems failing catastrophically, we investigate limits to communicating over channels that fail at random times. These channels are finite-state semi-Markov channels. We show that communication with arbitrarily small probability of error is not possible. Making use of results in finite blocklength channel coding, we determine sequences of blocklengths that optimize transmission volume communicated at fixed maximum message error probabilities. We provide a partial ordering of communication channels. A dynamic programming formulation is used to show the structural result that channel state feedback does not improve performance.en_US
dc.format.extentp. 5711 - 5724en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofIEEE Transactions on Information Theory
dc.subjectChannel codingen_US
dc.subjectCommunication channelsen_US
dc.subjectDynamic programmingen_US
dc.subjectFinite blocklength regimeen_US
dc.subjectReliability theoryen_US
dc.subjectArtificial intelligence and image processingen_US
dc.subjectElectrical and electronic engineeringen_US
dc.subjectCommunications technologiesen_US
dc.subjectNetworking & telecommunicationsen_US
dc.titleAn information-theoretic characterization of channels that dieen_US
dc.title.alternativeChannels that dieen_US
dc.typeArticleen_US
dc.description.versionFirst author draften_US
dc.identifier.doi10.1109/tit.2012.2199078
pubs.elements-sourcecrossrefen_US
pubs.notesEmbargo: No embargoen_US
pubs.organisational-groupBoston Universityen_US
pubs.organisational-groupBoston University, College of Engineeringen_US
pubs.organisational-groupBoston University, College of Engineering, Department of Electrical & Computer Engineeringen_US
pubs.publication-statusPublisheden_US
dc.identifier.orcid0000-0001-8471-7049 (Goyal, Vivek K)
dc.identifier.mycv36891


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