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URI: http://hdl.handle.net/2144/973

Welcome to the Department of Electrical & Computer Engineering

The Department of Electrical & Computer Engineering (ECE) offers a world-class education and conducts innovative research at the forefront of evolving technologies like computer hardware and software development, electronic and photonic devices, as well as sensing, processing and communication of various forms of information. With a renowned faculty, interdisciplinary research focus, cutting-edge facilities, and diverse student body, ECE is at the forefront of the technological breakthroughs that are shaping the future. Research activities in ECE are broadly classified into three primary areas: Computer Engineering, Electro-Physics, and Information and Data Sciences. The boundaries between these groups are not sharp, and interaction and cross-fertilization is common. In addition to rigorous class work, ECE degree programs encourage students to pursue hands-on research under the guidance of our accomplished faculty and in cooperation with university-wide centers and cross-disciplinary collaborations. This combination of practical and theoretical education ensures a breadth of experience in innovative problem solving and exploration that will prepare graduates for wide-range of interdisciplinary engineering careers.

ECE Contacts

Boston University Department of Electrical & Computer Engineering
W. Clem Karl, PhD, Chair
8 St. Mary's St., Room 324
Phone: (617) 353-2811
Fax: (617) 353-7337
www.bu.edu/ece

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Recently Added

  • Nonlinear digital post-processing to mitigate jitter in sampling 

    Weller, Daniel S.; Goyal, Vivek K. (2018)
    This paper describes several new algorithms for estimating the parameters of a periodic bandlimited signal from samples corrupted by jitter (timing noise) and additive noise. Both classical (non-random) and Bayesian ...
  • Time-resolved focused ion beam microscopy: modeling, estimation methods, and analyses 

    Peng, Minxu; Murray-Bruce, John; Goyal, Vivek K. (2021)
    In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a micrograph. Randomness of the number of ...
  • On-off random access channels: a compressed sensing framework 

    Fletcher, Alyson K.; Rangan, Sundeep; Goyal, Vivek K. (2009)
    This paper considers a simple on-off random multiple access channel, where n users communicate simultaneously to a single receiver over m degrees of freedom. Each user transmits with probability 𝛌, where typically 𝛌n < ...
  • SWAGGER: sparsity within and across groups for general estimation and recovery 

    Saunders, Charles; Goyal, Vivek K. (2020)
    Penalty functions or regularization terms that promote structured solutions to optimization problems are of great interest in many fields. Proposed in this work is a nonconvex structured sparsity penalty that promotes ...
  • Malleable coding: compressed palimpsests 

    Varshney, Lav R.; Kusuma, Julius; Goyal, Vivek K. (2018)
    A malleable coding scheme considers not only compression efficiency but also the ease of alteration, thus encouraging some form of recycling of an old compressed version in the formation of a new one. Malleability cost is ...
  • Benefiting from disorder: source coding for unordered data 

    Varshney, Lav R.; Goyal, Vivek K. (2018)
    The order of letters is not always relevant in a communication task. This paper discusses the implications of order irrelevance on source coding, presenting results in several major branches of source coding theory: lossless ...
  • High-flux single-photon lidar 

    Rapp, Joshua; Ma, Yanting; Dawson, Robin M.A.; Goyal, Vivek K. (The Optical Society, 2021-01-20)
    In time-correlated single-photon counting (TCSPC), photons that arrive during the detector and timing electronics dead times are missed, causing distortion of the detection time distribution. Conventional wisdom holds that ...
  • Predicting dead time distortion for high-flux single-photon lidar 

    Rapp, Joshua; Ma, Yanting; Dawson, Robin M.A.; Goyal, Vivek K. (OSA, 2020)
    Detector and electronics dead times distort photon detection histograms at high flux, but can be mitigated by probabilistic modeling identifying the sequence of detections as a Markov chain.
  • Compressively sampling the optical transmission matrix of a multimode fibre 

    Li, Shuhui; Saunders, Charles; Lum, Daniel J.; Murray-Bruce, John; Goyal, Vivek K.; Čižmár, Tomáš; Phillips, David B. (2021-04-21)
    The measurement of the optical transmission matrix (TM) of an opaque material is an advanced form of space-variant aberration correction. Beyond imaging, TM-based methods are emerging in a range of fields, including optical ...
  • Two-dimensional non-line-of-sight scene estimation from a single edge occluder 

    Seidel, Sheila W.; Murray-Bruce, John; Ma, Yanting; Yu, Christopher; Freeman, William T.; Goyal, Vivek K. (Institute of Electrical and Electronics Engineers (IEEE), 2021)

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