First born model for reflection-mode Fourier ptychographic microscopy

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MATH-2018-MM3D.2.pdf(377.54 KB)
Published version
Date
2018
Authors
Matlock, Alex
Sentenac, Anne
Yi, Ji
Tian, Lei
Version
Published version
OA Version
Citation
Alex Matlock, Anne Sentenac, Ji Yi, Lei Tian. 2018. "First Born model for reflection-mode Fourier ptychographic microscopy." Mathematics in Imaging. Mathematics in Imaging. https://doi.org/10.1364/math.2018.mm3d.2
Abstract
We validate a first Born approximation based model for Reflection-mode Fourier ptychography under the semi-infinite boundary condition. Our model enables optical thickness and absorption recovery with enhanced resolution from thin samples.
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License
© 2018 The Author(s)