Seidel, Sheila W.Watkins, LuisaPeng, MinxuAgarwal, AkshayYu, ChristopherGoyal, Vivek K.2023-03-202023-03-202022S.W. Seidel, L. Watkins, M. Peng, A. Agarwal, C. Yu, V.K. Goyal. 2022. "Online Beam Current Estimation in Particle Beam Microscopy" IEEE transactions on computational imaging, Volume 8, pp.521-535. https://doi.org/10.1109/tci.2022.31822122573-04362333-9403https://hdl.handle.net/2144/45766p. 521-535en-USElectron microscopyEstimation theoryFisher informationGallium ion beamHelium ion beamNeon ion beamNeyman type A distributionPoisson processesTouchard polynomialsOnline beam current estimation in particle beam microscopyArticle2023-01-1110.1109/tci.2022.31822120000-0002-1239-3003 (Seidel, Sheila W)0000-0002-3452-7455 (Watkins, Luisa)0000-0003-1041-8278 (Peng, Minxu)0000-0002-5944-3346 (Agarwal, Akshay)0000-0001-8471-7049 (Goyal, Vivek K)761275