Watkins, LuisaSeidel, SheilaPeng, MinxuAgarwal, AkshayYu, ChristopherGoyal, Vivek2022-03-222022-03-222021-08L. Watkins, S. Seidel, M. Peng, A. Agarwal, C. Yu, V. Goyal. 2021. "Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing." Microscopy and Microanalysis, Volume 27, Issue S1, pp. 422 - 425. https://doi.org/10.1017/s14319276210020261431-92761435-8115https://hdl.handle.net/2144/44066p. 422 - 425en-USArticle10.1017/s1431927621002026638023