Ion count-aided microscopy for quantitative, shot noise-mitigated secondary electron imaging

Agarwal, AkshayKasaei, LeilaHe, XinglinKitichotkul, RuangraweeHitit, Oguz KaganAlbert Schultz, J.Feldman, Leonard C.Goyal, Vivek2025-04-112025-04-112024-07-24A. Agarwal, L. Kasaei, X. He, R. Kitichotkul, O.K. Hitit, J. Albert Schultz, L.C. Feldman, V. Goyal. 2024. "Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging" Microscopy and Microanalysis, Volume 30, Issue Supplement_1. https://doi.org/10.1093/mam/ozae044.9871431-92761435-8115https://hdl.handle.net/2144/50065enCondensed matter physicsBiochemistry and cell biologyMaterials engineeringMicroscopyIon count-aided microscopy for quantitative, shot noise-mitigated secondary electron imagingArticle10.1093/mam/ozae044.9870000-0001-8471-7049 (Goyal, Vivek)1032294