Yeh, Li-HaoTian, LeiWaller, Laura2017-05-092017-05-092017-02-01Li-Hao Yeh, Lei Tian, Laura Waller. 2017. "Structured illumination microscopy with unknown patterns and a statistical prior.." Biomed Opt Express, Volume 8, Issue 2, pp. 695 - 711.https://hdl.handle.net/2144/22006Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the illumination patterns, which implies a well-calibrated and aberration-free system. Here, we propose a new algorithmic self-calibration strategy for SIM that does not need to know the exact patterns a priori, but only their covariance. The algorithm, termed PE-SIMS, includes a pattern-estimation (PE) step requiring the uniformity of the sum of the illumination patterns and a SIM reconstruction procedure using a statistical prior (SIMS). Additionally, we perform a pixel reassignment process (SIMS-PR) to enhance the reconstruction quality. We achieve 2× better resolution than a conventional widefield microscope, while remaining insensitive to aberration-induced pattern distortion and robust against parameter tuning.p. 695 - 711Copyright 2016 Optical Society of America. The accepted manuscript of this article is being made available in OpenBU under Boston University's open access policy.Blind deconvolutionSuperresolutionMicroscopyComputational imagingScience & technologyLife sciences & biomedicineBiochemical research methodsOpticsRadiology, nuclear medicineBiochemistry & molecular biologyPhase-shift estimationFluorescence microscopySpeckle illuminationLateral superresolutionConfocal microscopyResolution limitExcitationAlgorithmMedical imagingArticle10.1364/BOE.8.0006950000-0002-1316-4456 (Tian, Lei)