Cakir, FatihHe, KunXia, XideKulis, BrianSclaroff, Stan2020-05-112020-05-112019-06Fatih Cakir, Kun He, Xide Xia, Brian Kulis, Stan Sclaroff. 2019. "Deep Metric Learning to Rank." 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). 2019-06-15 - 2019-06-20. https://doi.org/10.1109/cvpr.2019.00196https://hdl.handle.net/2144/40725We propose a novel deep metric learning method by revisiting the learning to rank approach. Our method, named FastAP, optimizes the rank-based Average Precision measure, using an approximation derived from distance quantization. FastAP has a low complexity compared to existing methods, and is tailored for stochastic gradient descent. To fully exploit the benefits of the ranking formulation, we also propose a new minibatch sampling scheme, as well as a simple heuristic to enable large-batch training. On three few-shot image retrieval datasets, FastAP consistently outperforms competing methods, which often involve complex optimization heuristics or costly model ensembles.en-USRepresentation learningDeep learningRecognitionGradient methodsImage retrievalLearning (artificial intelligence)Neural netsOptimisationDetectionCategorizationConference materials10.1109/cvpr.2019.001960000-0002-0711-4313 (Sclaroff, Stan)536252