Yurdakul, CelalettinAvci, OguzhanMatlock, AlexTian, LeiOzbay, EkmelÜnlü, M. Selim2020-04-162020-04-162019Celalettin Yurdakul, Oguzhan Avci, Alex Matlock, Lei Tian, Ekmel Ozbay, M Selim Ünlü. 2019. "High-resolution Imaging of Nanoparticles in Wide-field Interferometric Scattering Microscopy." Computational Optical Sensing and Imaging. Imaging and Applied Optics 2019. https://doi.org/10.1364/cosi.2019.cw4a.4https://hdl.handle.net/2144/40199Single particle interferometric scattering microscopy has demonstrated great capability in label-free imaging of sub-wavelength dielectric nanoparticles (r<25 nm); however, it suffers from diffraction-limited resolution. Here, we demonstrate ~2-fold improvement in lateral resolution upon asymmetric illumination.p. CW4A.4en-US© 2019 The Author(s)Interference microscopyNanoparticle detectionBiosensingComputational imagingConference materialshttps://doi.org/10.1364/COSI.2019.CW4A.40000-0002-1316-4456 (Tian, Lei)488040