Inverse scattering for reflection intensity phase microscopy

Files
1912.07709.pdf(3.94 MB)
Accepted manuscript
Date
2020-02-01
Authors
Matlock, Alex
Sentenac, Anne
Chaumet, Patrick C.
Yi, Ji
Tian, Lei
Version
OA Version
Accepted manuscript
Citation
Alex Matlock, Anne Sentenac, Patrick C Chaumet, Ji Yi, Lei Tian. 2020. "Inverse scattering for reflection intensity phase microscopy." Biomedical Optics Express, Volume 11, Issue 2, pp. 911 - 926. https://doi.org/10.1364/BOE.380845
Abstract
Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under diverse illumination. We evaluate the forward and inverse scattering model based on the first Born approximation for imaging scattering objects above a glass slide. Under this design, the measured field combines linear forward-scattering and height-dependent nonlinear back-scattering from the object that complicates object phase recovery. Using only the forward-scattering, we derive a linear inverse scattering model and evaluate this model's validity range in simulation and experiment using a standard reflection microscope modified with a programmable light source. Our method provides enhanced contrast of thin, weakly scattering samples that complement transmission techniques. This model provides a promising development for creating simplified intensity-based reflection quantitative phase imaging systems easily adoptable for biological research.
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License
Copyright 2020 Optical Society of America. The final author draft of this article is being made available in OpenBU under Boston University's open access policy.