Prevention beats removal: avoiding stripe artifacts from current variation in particle beam microscopy through time-resolved sensing

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M&M 2021 PDFA.pdf(943.36 KB)
Accepted manuscript
Date
2021-08
DOI
10.1017/s1431927621002026
Authors
Watkins, Luisa
Seidel, Sheila
Peng, Minxu
Agarwal, Akshay
Yu, Christopher
Goyal, Vivek
Version
Accepted manuscript
URI
https://hdl.handle.net/2144/44066
OA Version
Citation
L. Watkins, S. Seidel, M. Peng, A. Agarwal, C. Yu, V. Goyal. 2021. "Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing." Microscopy and Microanalysis, Volume 27, Issue S1, pp. 422 - 425. https://doi.org/10.1017/s1431927621002026
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BU Open Access Articles
ENG: Electrical and Computer Engineering: Scholarly Papers