Ion count-aided microscopy for quantitative, shot noise-mitigated secondary electron imaging

Ion count-aided microscopy for quantitative, shot noise-mitigated secondary electron imaging

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Agarwal MM2024 for repositories PDFA.pdf(437.04 KB)

Accepted manuscript

Date

2024-07-24

DOI

10.1093/mam/ozae044.987

Authors

Agarwal, Akshay

Kitichotkul, Ruangrawee

Hitit, Oguz Kagan

Albert Schultz, J.

Feldman, Leonard C.

Version

Accepted manuscript

URI

https://hdl.handle.net/2144/50065

Citation

A. Agarwal, L. Kasaei, X. He, R. Kitichotkul, O.K. Hitit, J. Albert Schultz, L.C. Feldman, V. Goyal. 2024. "Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging" Microscopy and Microanalysis, Volume 30, Issue Supplement_1. https://doi.org/10.1093/mam/ozae044.987

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