High-resolution broadband spectroscopy using externally dispersed interferometry at the Hale telescope: Part 1, data analysis and results
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Published version
Date
2016-05-27
Authors
Erskine, David J.
Edelstein, Jerry
Wishnow, Edward H.
Sirk, Martin
Muirhead, Philip S.
Muterspaugh, Matthew W.
Lloyd, James P.
Ishikawa, Yuzo
McDonald, Eliza A.
Shourt, William V.
Version
OA Version
Citation
David J. Erskine, Jerry Edelstein, Edward H. Wishnow, Martin Sirk, Philip S. Muirhead, Matthew W. Muterspaugh, James P. Lloyd, Yuzo Ishikawa, Eliza A. McDonald, William V. Shourt, Andrew M. Vanderburg, “High-resolution broadband spectroscopy using externally dispersed interferometry at the Hale telescope: Part 1, data analysis and results,” J. Astron. Telesc. Instrum. Syst. 2 (2), 025004 (2016), doi: 10.1117/1.JATIS.2.2.025004.
Abstract
High-resolution broadband spectroscopy at near-infrared wavelengths (950 to 2450 nm) has been performed using externally dispersed interferometry (EDI) at the Hale telescope at Mt. Palomar. Observations of stars were performed with the “TEDI” interferometer mounted within the central hole of the 200-in. primary mirror in series with the comounted TripleSpec near-infrared echelle spectrograph. These are the first multidelay EDI demonstrations on starlight, as earlier measurements used a single delay or laboratory sources. We demonstrate very high (10×) resolution boost, from original 2700 to 27,000 with current set of delays (up to 3 cm), well beyond the classical limits enforced by the slit width and detector pixel Nyquist limit. Significantly, the EDI used with multiple delays rather than a single delay as used previously yields an order of magnitude or more improvement in the stability against native spectrograph point spread function (PSF) drifts along the dispersion direction. We observe a dramatic (20×) reduction in sensitivity to PSF shift using our standard processing. A recently realized method of further reducing the PSF shift sensitivity to zero is described theoretically and demonstrated in a simple simulation which produces a 350× times reduction. We demonstrate superb rejection of fixed pattern noise due to bad detector pixels—EDI only responds to changes in pixel intensity synchronous to applied dithering. This part 1 describes data analysis, results, and instrument noise. A section on theoretical photon limited sensitivity is in a companion paper, part 2.
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Copyright 2016 Society of Photo Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited.