High-resolution Imaging of nanoparticles in wide-field interferometric scattering microscopy
Files
Published version
Date
2019
Authors
Yurdakul, Celalettin
Avci, Oguzhan
Matlock, Alex
Tian, Lei
Ozbay, Ekmel
Ünlü, M. Selim
Version
Published version
OA Version
Citation
Celalettin Yurdakul, Oguzhan Avci, Alex Matlock, Lei Tian, Ekmel Ozbay, M Selim Ünlü. 2019. "High-resolution Imaging of Nanoparticles in Wide-field Interferometric Scattering Microscopy." Computational Optical Sensing and Imaging. Imaging and Applied Optics 2019. https://doi.org/10.1364/cosi.2019.cw4a.4
Abstract
Single particle interferometric scattering microscopy has demonstrated great capability in label-free imaging of sub-wavelength dielectric nanoparticles (r<25 nm); however, it suffers from diffraction-limited resolution. Here, we demonstrate ~2-fold improvement in lateral resolution upon asymmetric illumination.
Description
License
© 2019 The Author(s)