Denoising particle beam micrographs with plug-and-play methods

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Peng TCI for archiving PDFA.pdf(7.1 MB)
Accepted manuscript
Date
2023
DOI
10.1109/tci.2023.3282042
Authors
Peng, Minxu
Kitichotkul, Ruangrawee
Seidel, Sheila W.
Yu, Christopher
Goyal, Vivek K.
Version
Accepted manuscript
URI
https://hdl.handle.net/2144/48715
OA Version
Citation
M. Peng, R. Kitichotkul, S.W. Seidel, C. Yu, V.K. Goyal. 2023. "Denoising Particle Beam Micrographs With Plug-and-Play Methods" IEEE transactions on computational imaging, Volume 9, pp.581-593. https://doi.org/10.1109/tci.2023.3282042
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